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Breakdown and Leakage Current Measurements on High Voltage Semiconductor Devices

Breakdown and Leakage Current Measurements 2470

Keithley has long had a strong presence in high power semiconductor device test. Most recently, Keithley introduced the 2470 1.1 kV Graphical SourceMeter® Source Measure Unit to address challenging measurements for SiC and GaN device testing. This application note considers the application of this new source measure unit with Keithley’s KickStart software for high voltage semiconductor
device testing.