Correlation of Measurement and Simulation Results using IBIS-AMI Models on Measurement Instruments (DesignCon 2014)

Increasing serial bus data rates have resulted in requirements for de-embedding measurement circuits, embedding compliance channels, and applying reference equalizers to open closed data eyes for signal integrity evaluations.  To assist in the design task on these high speed buses, S-parameter and IBIS-AMI models are often used in the simulation environment to model silicon-specific behavior; while in the measurement environment, S-parameters and reference equalizers have been used.  The two different methodologies have led to correlation mismatches between measurement and simulation results.  A new technique enabling IBIS-AMI support in the measurement environment permits the acquisition of real-time data from the DUT to be run directly through a modeled receiver, enabling the evaluation of true receiver performance and overcoming correlation issues.

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