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Multi-Site Parallel Testing with the S535 Wafer Acceptance Test System

In semiconductor wafer production, minimizing the cost of test has been identified as the number one challenge.  The biggest factor in the cost of test, as well as in the cost of test system ownership, is throughput of the tester/prober combination.  This application note shows how using a multi-site parallel test system can cut the total cost of ownership in half by doubling production throughput while reducing the number of probers, freeing up fab floor space, and reducing maintenance requirements.