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Option 6-CMNBASET and 6-CMXGBT Application Datasheet
Ethernet (2.5G, 5G and 10G) Electrical Testing Software for 6 Series MSO
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The Ethernet Transmitter Test application automates 10GBASE-T, NBASE-T (2.5GBASE-T and 5GBASE-T), and IEEE802.3bz (2.5G/5G) physical medium attachment (PMA) physical-layer (PHY) electrical testing to provide a fast and accurate way of testing your ethernet designs.
Based on the TekExpress test automation framework, the Ethernet Transmitter Test application performs all PMA electrical measurements as specified by the IEEE802.3an standard, the IEEE802.3bz standard, and the NBASE-T specification. This allows you to quickly and efficiently test ethernet devices running at 2.5G, 5G, and 10G data rates.
To accurately make these measurements, you need the Tektronix TF-XGBT test fixture. The TF-XGBT test fixture allows you to easily access the device under test (DUT) using either differential probes or matched SMA cables.
Comprehensive automated solution for 2.5GBASE-T, 5GBASE-T and 10GBASE-T PHY testing
Highly optimized and user friendly interface flow that sets up the test configuration for quick validation of electrical signals.
Compliance and margin testing for accurate analysis and improved interoperability.
Time-domain and frequency-domain measurements made with single analysis instrument.
Test execution on an oscilloscope with remote control using programmatic interface from an external PC.
Single instrument analysis of time and frequency domain measurements.
Signal acquisition and analysis support for differential probes or direct SMA cabling.
Test selection and instrument setup
Test selection is easy and straight forward through the intuitive TekExpress workflow. Select the measurements to execute and click on Start button.
For each measurement selected, the Ethernet Transmitter application automatically configures the oscilloscope, saving setup time and ensuring repeatable, reliable results.
As each test is performed, the application guides you through the connection diagrams.
A summary report with Pass/Fail status for each test is created after the test execution is complete. This report includes test configuration details, waveform plots, and margin analysis to provide more insight into your design.
You can make changes to test specific parameters like test limits and other parameters to perform detailed margin analysis to validate your device performance.
Droop configuration parameters
Probe support for signal acquisition
The application allows signal acquisition and analysis with either matched pair SMA cables or differential probes.
Differential and single-ended probe support
The automated test application simplifies Return Loss testing and eliminates the need for a Vector Network Analyzer by using a patented oscilloscope-based measurement along with a Tektronix AWG. Calibration data for Open, Load, and Short can be stored in a file and recalled in the test application.
Complete programming interface
The TekExpress application provides a programmatic interface with support for a high-level automation layer such as Visual Basic, Microsoft.Net, C#, C++, Python, or any other web application. This lets you control the execution of the TekExpress Ethernet application running on an oscilloscope from a local machine or using a remote computer.
Programming examples are found in the application examples folder.
Offline analysis feature of the TekExpress Ethernet application allows the user to analyze the already acquired waveforms. Select Use pre-recorded waveform files in the application DUT panel to acquire the waveforms and save it as a waveform files.
This allows the waveforms to be captured from an oscilloscope and shared across multiple users, sites to perform analysis using other oscilloscopes.
Offline analysis using pre-recorded waveform files
- 10GBASE-T measurements
The following tests are performed as per the IEEE802.3-2012 standard. The device under test (DUT) must be able to provide the test mode signals as indicated in IEEE802.3-2012 Subclause 55.5.2.
Measurement Standard reference and Test mode Maximum Output Droop IEEE802.3-2012 Subclause 220.127.116.11 Transmitter Timing Jitter - Master IEEE802.3-2012 Subclause 18.104.22.168 Transmit Clock Frequency IEEE802.3-2012 Subclause 22.214.171.124 Transmitter Timing Jitter - Slave IEEE802.3-2012 Subclause 126.96.36.199 Transmitter Linearity IEEE802.3-2012 Subclause 188.8.131.52 Transmitter Power Spectral Density (PSD) and Power IEEE802.3-2012 Subclause 184.108.40.206 Return Loss IEEE802.3-2012 Subclause 220.127.116.11
- 2.5GBASE-T and 5GBASE-T measurements
The following tests are performed as per the IEEE802.3bz/D3.3 draft standard. The device under test (DUT) must be able to provide the test mode signals as indicated in IEEE802.3bz/D3.3 Subclause 126.5.2.
Measurement Test mode Maximum Output Droop IEEE80.bz/D3.3 Subclause 18.104.22.168 Transmitter Timing Jitter - Master IEEE80.bz/D3.3 Subclause 22.214.171.124 Transmit Clock Frequency IEEE80.bz/D3.3 Subclause 126.96.36.199 Transmitter Timing Jitter - Slave IEEE80.bz/D3.3 Subclause 188.8.131.52 Transmitter Nonlinear Distortion IEEE80.bz/D3.3 Subclause 184.108.40.206 Transmitter Power Spectral Density (PSD) and Power IEEE80.bz/D3.3 Subclause 220.127.116.11 Return Loss IEEE80.bz/D3.3 Subclause 18.104.22.168
- NBASE-T measurements
The following tests are performed as per the NBASE-T Physical Layer Specification. The device under test (DUT) must be able to provide the test mode signals as indicated in NBASE-T Physical Layer Specification version 1.1 Subclause 2.9.
Measurement Test mode Maximum Output Droop Subclause 22.214.171.124, Test Mode 6 Transmitter Timing Jitter - Master Subclause 126.96.36.199, Test Mode 2 Transmit Clock Frequency Subclause 188.8.131.52, Test Mode 2 Transmitter Timing Jitter - Slave Subclause 184.108.40.206, Test Mode 1 and Mode 3 Transmitter Nonlinear Distortion Subclause 220.127.116.11, Test Mode 4, Tones 1-5 Transmitter Power Spectral Density (PSD) and Power Subclause 18.104.22.168, Test Mode 5 Return Loss Subclause 22.214.171.124, Test Mode 5
|Oscilloscope||6 Series MSO oscilloscope with minimum bandwidth of 4 GHz (option 6-BW-4000)|
|Required option||6-WIN (Removable SSD with Microsoft Windows 10 operating system)|
|Ethernet (2.5G and 5G BASE-T) Automated Compliance Solution||6-CMNBASET||New instrument license|
|Ethernet (10G BASE-T) Automated Compliance Solution||6-CMXGBT||New instrument license|
|TDP3500||1 (minimum) 1|
1*Quantity 2x, if performing Return loss measurement and 4x for testing multi-lane.
|Power Splitter - PSPL5331||2|
|SMA to BNC adopter PN: 015057200||4|
AWG compatibility (For Return Loss Measurements)
AWG5202 with option 250,2HV and 2DC (recommended), AWG7122C
IEEE 2.5GBASE-T Transmitter Non-linear Distortion Test (Section 126.96.36.199)
This test requires a 45 MHz sine wave to be injected, as per the specification. This is only required for 2.5GBASE-T. The supported signal sources are:
- AWG5202 , AFG3052C, AFG3102C, AFG3152C, AFG3252C (Recommended), AWG5002C, AWG5012C, AWG5014C, AWG7082C, AWG7122C
TF-XGBT 10GBASE-T, NBASE-T, and IEEE802.3bz
The TF-XGBT test fixture is required to perform all measurements and is designed to meet the test fixture requirements in each of the applicable specifications/standards.
|Test fixture main board||1||Main test fixture consist of 3 sections:
|Test fixture calibration board||1||Required for Return Loss calibration|
|RJ45 patch cord||2||0.08 meter, shielded RJ45 cable to connect the test fixture to the Return Loss calibration board and the device under test|
|China RoHS sheet||1|