Программные решения компании Tektronix для тестирования приёмников и передатчиков удовлетворяют потребности в проверках правильности электрических характеристик, их соответствия требованиям, а также в определении характеристик и отладке для инженеров, разрабатывающих системы на основе USB 3.1 Type-C, USB 3.1 и USB 2.0, соответствующие стандартам на испытания USB-IF. Также имеется решение для электрических параметрических измерений и измерений по протоколу USB-PD для обеспечения соответствия.

НОВИНКА! Автоматизированное программное решение для испытания устройств с USB 3.1 типа C

Тестирование передатчиков и приёмников с помощью осциллографов и устройств BERT компании Tektronix 

  • НОВИНКА! BERTScope серии BSX поддерживает встроенную архитектуру DPP 1-го поколения при скорости передачи данных 5 Гбит/с и 2-го поколения при 10 Гбит/с, совместимую с протоколом. 
  • Выполните анализ протокола в сочетании с проверкой электрических характеристик, используя функцию синхронизации по сигналам последовательных интерфейсов осциллографов серии MSO/DPO70000 DX
  • Получите самую точную оценку характеристик и предельных отклонений с помощью осциллографов серии DPO70000SX, обеспечивающих самый низкий уровень шумов в этом классе приборов.
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Understanding and Performing USB 2.0 Physical Layer Testing

This application note provided an overview of USB 2.0 physical layer testing including signal quality, in-rush current check, drop and droop tests. It describes tests for high-speed mode, and information on using protocol analysis for debugging.

The Basics of Serial Data Compliance and Validation Measurements

This primer is designed to help you understand the common aspects of serial data transmission & to explain the analog and digital measurement requirements that apply to these emerging serial technologies

USB 3.1 Receiver Compliance Testing

All aspects of USB 3.1 receiver testing are covered, including stressed eye calibration and jitter tolerance testing with measured device margin.

Advanced Serdes Debug with a BERT

Learn simple strategies to pinpoint bit errors to the exact bit position and timing with powerful Error Location Analysis and a BERT.

High Speed Interface StandardsThis e-Guide will help you learn more about design challenges for testing PCIe 4.0, SAS, SuperSpeed USB, and DDR4 standards. Within the pages of the eGuide you will also get quick access to technical resources that will help you understand design challenges and pick the right solution for your test needs.
USB 2.0 Compliance SolutionThis fact sheet details the recommended equipment to meet the USB 2.0 compliance testing requirements.
Debugging Serial Buses in Embedded System Designs

Find out how the protocol trigger, decode and search capabilities of the popular MSO and DPO Series oscilloscopes solve serial bus integration and debug challenges of many buses such as I2C, SPI , USB, RS-232/422/485/UART, CAN, LIN, FlexRay, Ethernet, and I2S/LJ/RJ/TDM.

USB 3.0 Physical Layer Measurements

Evaluation Engineering

Simplifying Validation and Debug of USB 3.1 Designs

This application note explores the new challenges associated with USB 3.0 and the tools needed for validation and debug of superspeed designs.

Debug physical layer and link training issues quickly for standards running up to…


Get the full featured spectrum analyzers you need in one small, low price package…

This short video demonstrates testing concepts for USB 3.1 Transmitter Testing;…

Discover how to use a Tektronix MSO5000B Series Oscilloscope to validate the…


Learn how to dramatically cut down test time on required compliance interop tests…

Simplify your USB Type-C Design Validation - From Complexity to Confidence.

Comprehensive tools for debugging failures are key to building confidence that your product will pass compliance and achieve certification. This in-depth webinar will help simplify your validation tasks, moving from complexity to confidence.

Testing USB 3.1 View this short webinar to learn more about this new standard and how to prepare for compliance tests.
USB 2.0 Host MOI

High-Speed Electrical Testing - Host MOI

USB 2.0 Hub MOI

High-Speed Electrical Testing - Hub MOI

Tektronix USB2.0 Device MOIUSB 2.0 Universal Serial Bus Measurement MOI
Tektronix High-Speed Electrical Testing - Host MOI High-Speed Electrical Testing - Host MOI
High-Speed Electrical Testing - Hub MOIHigh-Speed Electrical Testing - Hub MOI
USB 3.1 Receiver Testing MOIThis MOI reviews the methods used for USB 3.1 (10 Gb/s) receiver compliance testing using the BERTScope Bit Error Rate Testers.
USB 2.0 Test Procedures MOIUSB 2.0 Test Procedures Method of Implementation
USB 3.1 Cable Tests MOIThis MOI specifies the testing procedures for the SuperSpeed channels of a USB 3.1 cable and mated cable assembly including Type-C to Type-C and Type-C to legacy connectors.
USB 3.0 Cable Tests MOIThis MOI specifies the testing procedures for the Super Speed channels of a USB 3.0 cable and mated cable assembly..
USB 3.0 Receiver Testing MOIThis MOI reviews the methods used for USB 3.0 receiver compliance testing using the BERTScope Bit Error Rate Testers.

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